Photo of collection object Diagram of an Application-Specific Integrated Circuit (ASIC), Test Chip — Xerox Palo Alto Research Center. Diagram of an Application-Specific Integrated Circuit (ASIC), Test Chip, 1986. Computer-generated plot on paper, 92 1/2 x 42 1/2" (235 x 108 cm). Gift of the manufacturer, 527.1990. (Photo: MoMA)

MoMA

Diagram of an Application-Specific Integrated Circuit (ASIC), Test Chip

1986

Xerox Palo Alto Research Center

American, est. 1906

Architecture & Design

Original Source

Maker/Artist: Xerox Palo Alto Research Center
Classification: Design
Formatted Medium: Computer-generated plot on paper
Medium: computer-generated, plot, paper
Dimensions: 92 1/2 x 42 1/2" (235 x 108 cm)
Departments: Architecture & Design
Accession Number: 527.1990
Credit Line: Gift of the manufacturer
Dominant Colors

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